LINSEIS Messgeraete L79 HCS Semiconductor Characterization Device
The L79/HCS system allows for the characterization of semiconductor devices, measuring: mobility, resistance, carrier concentration, and Hall coefficient.
- The setup offers a variety of sample holders for different geometries and temperature requirements. Low temperature (LN) can be selected2) accessories and a high temperature version up to +800°C, ensuring that all application areas can be covered.
- Various permanent and electric magnets provide magnetic fields up to several teslas.
- A comprehensive Windows-based software package provides the ability to obtain IV and IR graphs.
- The system can be used to characterize a variety of materials, including Si, SiGe, SiC, GaAs, InGaAs, InP, GaN (n-type and p-type can be measured), metal layers, oxides, etc. Sample studies can be performed to demonstrate the capabilities of the system.
Hall characterization system – LINZES Measuring instrument L79 HCS.
More information: on the manufacturer's website or send us an inquiry!
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