Bettersize Instruments Ltd. Bettersizer S3 Plus Laser Diffraction Particle Size and Shape Analyzer
The Bettersizer S3 Plus combines laser diffraction and dynamic image analysis in a single instrument. It can measure particle size and shape from 0.01 μm to 3500 μm. Its exceptional sensitivity for both ultrafine and oversized particles and unmatched resolution make it the most powerful size and shape analyzer for users across a wide range of industries, offering new solutions for more in-depth particle characterization.
- Patented DLOI (Dual Lenses & Oblique Incidence) System: Laser Diffraction
Laser diffraction technology remains the method of choice for routine particle size analysis across a wide range of industries. The Bettersizer S3 Plus uses a patented DLOI system based on a Fourier structure, ensuring accurate measurement of ultrafine particles from 0.01 μm.- Features
- Accurately measures ultrafine particles over a wide angular range (0.02 – 165°) with 96 detectors
- Strong optical system with excellent resolution using a dual lens design
- A single short-wavelength laser system (532 nm) generates a continuous scattering spectrum with a coherent wavelength
- No stabilization and warm-up time required with a solid-state light source
- Features
- Dual Camera System: Dynamic Image Analysis
Dynamic image analysis can enhance your understanding of materials by providing detailed shape or morphological information independent of laser diffraction. Individual particles with specific geometric properties, such as agglomerates, crushed particles, and foreign particles, can be effectively observed through a dual-camera system.- Features
- 0.5x and 10x cameras – capture an extremely wide range of particle sizes
- Fast stroboscopic light sources – capture up to 10,000 particle images in 60 seconds, offering authentic shape results
- Suitable for measuring heterogeneous samples with unknown optical properties
- Features
- Revolutionary Combination: Laser Diffraction with Dynamic Image Analysis
The Bettersizer S3 Plus integrates laser diffraction and dynamic image analysis into a single instrument, enabling simultaneous characterization of particle size, size distribution, and particle shape over a wide dynamic range. Working synchronously, users can gain a deeper understanding of material behavior, accelerating problem solving and method development.- Features
- DLOI System – accurately measures ultrafine particles from 0.01 μm
- Dual camera imaging system – effectively detects ultra-large particles up to 3,500 μm
- 2-in-1 System – obtains particle size and shape results at the same time
- Fast results – quickly generates results in 10 seconds
- Features
Laser diffraction analyzers – Bettersize
More information: on the manufacturer's website or send us an inquiry!