LINSEIS Messgeraete LSR semiconductor characterization device
Semiconductor Characterization Equipment – Seeback and impedance characterization system characteristics:
- The LSR-1 system characterizes metallic and semiconductor samples using well-known Van-der-Pauw and static DC and deflection Seebeck coefficient measurement techniques, measuring electrical resistivity and Seebeck coefficient.
- The compact benchtop equipment offers integrated sample holders for a variety of temperature requirements, including low temperature (LN2), heated (up to +200°C) and sealed measuring room.
- The comprehensive Windows-based software provides an easy-to-use interface with measurement profile setup wizards.
- The LSR-3 “LINSEIS – Seebeck and Electrical Resistivity Characterization System” evaluates materials by simultaneously measuring the Seebeck coefficient and electrical resistivity (ZT, using the Harman method).
- It is suitable for prismatic and cylindrical samples, ropes and films with interchangeable ovens (from -100°C to +1500°C).
- The design of the sample holder ensures high measurement reproducibility, and modern software enables automated measurement processes.
- Infrared heaters offer high heating and cooling rates and precise temperature control.
- Measurement principles: The sample is placed between two electrodes in an oven to measure electrical resistance in DC quaternary measurement.
Seebeck and Resistance Characterization System – LINZES Messgeraete.
More information: on the manufacturer's website or send us an inquiry!
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