„LINSEIS Messgeraete LZT laser semiconductor characterization device
Characteristics of the laser flash Seeback and impedance characterization system:
- The first commercial device in the world to measure the Accuracy Coefficient in a single measurement (combining LSR and LFA).
- The device combines three types of measurements: thermal conductivity, electrical resistance and Seebeck coefficient, meaning it can combine the functions of LSR and LFA.
- The analyzer is available with different types of ovens: a new infrared oven that provides very precise temperature control with very fast heating and cooling, a low temperature oven and a high temperature oven.
- The included software package allows for the evaluation of all measured data using the familiar LINSEIS software and also provides the Harman-ZT model.
Laser flash Seeback and impedance characterization system – LINZES Messgeraete.
More information: on the manufacturer's website or send us an inquiry!
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